Dr. Lorena ANGHEL got her PhD from Grenoble IT in 2000 in the domain of Fault Tolerance Techniques Future Nanometric Silicon technologies. She obtained the Grenoble IT Best PhD Award in 2000.
She is currently an Associate Professor at Grenoble IT - ENSERG, Engineering School attached to TIMA Laboratory, Grenoble, France. Her research interests include VLSI testing, fault and defect tolerance, soft error mitigation, reliable design, timing optimization, power analysis and optimization.
She has been an Organizing Committee member of IEEE VLSI Test Symposium, IEEE On-Line Test Symposium, and Program Committee member of IEEE Latin American Test Workshop and Design Automation and Test in Europe (DATE). She was the General Chair of IEEE On-Line Test Symposium, 2005. Dr. ANGHEL has been recipient of several Best Paper Awards, including one in DATE Conference.
Jean BRINI is born in 1947. He got from Grenoble IT his Engineering and State Ph.D in Electronics respectively in 1974 and 1981. He is researcher and professor since 1971. He has worked on neuromimetic disposals, physics of semiconductor devices, unijunction transistor, SOI devices modeling, RTS noise in MOS transistors, and noise in thin-film transistors. He is author and coauthor of more tan 100 publications in scientific revues.
He is a member of the Microelectronics, Electromagnetism and Photonics Institute (IMEP), Professor at Grenoble IT - ENSERG Engineering School, where he is Director of Courses and he teaches probabilities, physics pf electronics, information theory, quality and reliability.